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ps - at 7909 e revision a microcircuit, digital, cmos , monolithic silicon single chip telemetry and telecommand at7909e revision written by approved by date a v. briot / e. vannier c . ferr 21/05/2007 ?
ps - at7909e rev a sheet 2 / 20 documentati on change notice date of update revision letter modifications
ps - at7909e rev a sheet 3 / 20 summary 1 general ................................ ................................ ................................ ................................ ...... 4 1.1 scope ................................ ................................ ................................ ................................ ................. 4 1.2 identification ................................ ................................ ................................ ................................ ...... 4 1.3 absolute maximum ratings ................................ ................................ ................................ ................ 4 1.4 recomme nded operating conditions. ................................ ................................ ................................ 4 1.5 radiation features ................................ ................................ ................................ .............................. 4 1.6 handling precautions ................................ ................................ ................................ ......................... 4 2 applicable documents ................................ ................................ ................................ ..... 4 3 requirements ................................ ................................ ................................ ......................... 4 3.1 design, construction, and physical dimensions. ................................ ................................ ................. 4 3.1.1 package type. ................................ ................................ ................................ ................................ ...... 5 3.1.2 terminal connections. ................................ ................................ ................................ ........................... 5 3.1.3 block diagram. ................................ ................................ ................................ ................................ ..... 5 3.2 marking ................................ ................................ ................................ ................................ .............. 5 3.2.1 lead identification ................................ ................................ ................................ ................................ . 5 3.2.2 component number ................................ ................................ ................................ .............................. 5 3.2.3 traceability information ................................ ................................ ................................ ......................... 5 3.3 electrical characteristics ................................ ................................ ................................ .................... 5 3.4 burn - in test ................................ ................................ ................................ ................................ ......... 5 3.4.1 electrical circuit ................................ ................................ ................................ ................................ ... 5 3.4.2 parameters drift value ................................ ................................ ................................ ........................... 5 3.5 environmental and endurance tests ................................ ................................ ................................ .. 6 3.5.1 electrical circuit for operating lifetest ................................ ................................ ................................ ... 6 3.5.2 electrical measurem ents at completion of environmental and endurance tests ................................ .......... 6 3.5.3 conditions for operating lifetest ................................ ................................ ................................ ............ 6 4 quality assurance provisio ns ................................ ................................ .................... 6 4.1 wafer lot acceptance test ................................ ................................ ................................ .................. 6 4.2 sampling and inspection. ................................ ................................ ................................ .................. 6 4.3 screening. ................................ ................................ ................................ ................................ ......... 6 4.4 quality conformance inspection ................................ ................................ ................................ ........ 6 4.4.1 group a inspection. ................................ ................................ ................................ .............................. 6 4.4.2 group c inspection. ................................ ................................ ................................ .............................. 6 4.4.3 group d inspection. ................................ ................................ ................................ .............................. 7 4.5 delta measurements ................................ ................................ ................................ .......................... 7 5 packaging ................................ ................................ ................................ ................................ . 7 5.1 packaging requirements ................................ ................................ ................................ .................... 7 figures figure 1 . case outline. ................................ ................................ ................................ ................................ ................................ ................. 10 figure 2. terminal connections. ................................ ................................ ................................ ................................ ................................ 11 figure 3. block diagram ................................ ................................ ................................ ................................ ................................ .............. 13 figure 4. electrical circuit for power burn - in and operating life test. ................................ ................................ ................................ .... 14 tables table 1. electrical parameters ................................ ................................ ................................ ................................ ................................ ...... 8 table 2. parameter drift values ................................ ................................ ................................ ................................ ................................ ..... 9
ps - at7909e rev a sheet 4 / 20 1 general 1.1 scope this specification details the ratings, physical and electrical characteristics, tests and inspection data of the single chip telemetry and telecommand named at 7909e . it also defines the specific requirement for space and military applications with high reliability. 1.2 identification description case application at7909eka - mq flat pack 256 leads military application at7909eka - sv flat pack 256 leads space application 1.3 absolute maximum ratings supply voltage range (v dd ) ................................ ............. - 0.5v to 4v dc input voltage range (v in ) ................................ ................. - 0.5v dc to 6v dc input current per power pin ................................ ............. +/ - 60 ma input current par signal pin ................................ ............. +/ - 10 ma storage temperature ................................ ...................... - 65c to 150c max imum junction temperature (t j ) ................................ . 175c lead temperature (soldering @ 1/16 in, 10 s) ................... 300c thermal resistance junction to case ( r jc) ....................... 3.5 k /w 1.4 recommended operating conditions. supply voltage range (v dd ) ................................ ............. 3 v dc to 3.6 v dc ambient operating temperature (t a ) ................................ - 55c to 125c storage temperature ................................ ...................... 30c, 20 to 65% rh, dust free, original packing 1.5 radiation features tested up to a total dose (dose rate 0.1 rad/s) ................. 1 00 krads (si) 1.6 handling precautions these components are susceptible to damage by electrostatic disch arge. therefore, suitable precautions shall be employed for protection during all phases of manufacturing, testing, shipment and any handling. esd ................................ ................................ ............. >4000 v 2 applicable documents mil - prf - 38535 ................................ ...... integrated circuits, manufacturing, general specification for. mil - std - 883 ................................ ........ test method standard microcircuits. in the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. 3 requirements 3.1 design, construction, and physical dimensions. the desi gn, construction, and physical dimensions shall be as specified in mil - prf - 38535 and herein.
ps - at7909e rev a sheet 5 / 20 3.1.1 package type. t he package shall be a flat pack, 25 6 leads ( figure1 ). the case shall be hermetically sealed and have a ceramic body. lid shall be connected to grou nd . 3.1.2 terminal connections. the terminal connections shall be as specified on figure 2 . 3.1.3 block diagram. the block diagram shall be as specified on figure 3 . 3.2 marking each component shall be marked in respect of : (a) lead identification (b) component number (c) traceab ility information (d) manufacturer?s component number 3.2.1 lead identification an index shall be located at the top of the package in the position defined in figure 1 . 3.2.2 component number each component shall bear the component number which shall be con stituted and marked as follows : at 7909eka - xx product identification package ( ka = flat pack 25 6) level (mq=high reliability ? s v=space application) 3.2.3 traceability information each component shall be marked in respect of traceability information : lot number and date code. 3.3 electrical characteristics the parameters to be measured with respect of electrical characteristics are scheduled in table 1 . the measurements shall be performed at t amb = 25 3c, t high =125 (+0/ - 5)c and t low = - 55 (+5/ - 0)c respectively. 3.4 burn - in test 3.4.1 electrical circuit circuit for use in performing the power burn - in is shown in figure 4 , in accordance with the intent specified in test method 1015 of mil - std - 883.
ps - at7909e rev a sheet 6 / 20 3.4.2 parameters drift value for space application, the parameter drift values applicab le to burn - in are specified in table 2 of this specification. unless otherwise stated, measurements shall be performed at + 25 + 3 c. the parameter drift values ( d ), applicable to the parameters scheduled, shall not be exceeded. in addition to these drif t value requirements, the appropriate limit value specified for a given parameter in table 1 shall not be exceeded. . 3.5 environmental and endurance tests 3.5.1 electrical circuit for operating lifetest the circuit for operating life testing shall be as specified for power burn in (figure 4 ). 3.5.2 electrical measurements at completion of environmental and endurance tests the parameters to be measured are scheduled in table 1 . unless otherwise stated, the measurements shall be performed at t amb = 25 + 3c. 3.5.3 conditions fo r operating lifetest the conditions for operating life testing shall be as specified for power burn in. 4 quality assurance provisions 4.1 wafer lot acceptance test for space application, wafer lot acceptance shall be performed according to mil - std - 883 meth od 5007. 4.2 sampling and inspection. sampling and inspection procedures shall be in accordance with mil - prf - 38535. 4.3 screening. screening shall be in accordance with mil - prf - 38535, and shall be conducted on all devices prior to qualification and technology c onformance inspection the burn - in test duration, test condition and test temperature, or approved alternatives shall be as specified in accordance with mil - prf - 38535. additional screening for space application devices shall be as specified in mil - prf - 385 35, appendix b. 4.4 quality conformance inspection qualification inspection for high reliability and space applications devices shall be in accordance with mil - prf - 38535. inspections to be performed shall be those specified in mil - prf - 38535 and herein for gro ups a, b, c, d, and e inspections. 4.4.1 group a inspection. tests shall be as specified in table 1 herein. subgroups 5 and 6 of table i of method 5005 of mil std 883 shall be omitted. subgroups 7 and 8 of table i of method 5005 of mil std 883 shall include ver ifying the functionality of the device.
ps - at7909e rev a sheet 7 / 20 o/v (latch up) tests shall be measured only for the initial qualification and after any process or design changes which may affect the performance of the device. capacitance measurement shall be measured only for in itial qualification and after any process or design changes which may affect input or output capacitance. capacitance shall be measured between the designated terminal and gnd at a frequency of 1 mhz. sample size is five devices with no failure, and all in put and output terminals tested. 4.4.2 group c inspection. the group c inspection end - point electrical parameters shall be as specified in table 1 herein. 4.4.3 group d inspection. the group d inspection end - point electrical parameters shall be as specified in table 1 herein. 4.5 delta measurements delta measurements, as specified in table 2 , shall be made and recorded before and after the required burn - in screens and steady - state life tests to determine delta compliance. the electrical parameters to be measured, with associated delta limits are listed in table 2 . the device manufacturer may, at his option, either perform delta measurements or within 24 hours after life test perform final electrical parameter tests, subgroups 1, 7 and 9. 5 packaging 5.1 packaging requiremen ts the requirements for packaging shall be in accordance with mil - prf - 38535.
ps - at7909e rev a sheet 8 / 20 table 1. electrical parameters limits test symbol test metho d mil - std - 883 conditions - 55 c t c +125 c +3 v v dd +3.6 v unless otherwise specified min max unit high level input voltage v ih 3013 v dd =3.6v 2.0 v low level input voltage v il 3013 v dd =3.0v 0.8 v threshold schmitt trigger input voltage vt+ 3013 note 1 1.40 2.08 v threshold schmitt trigger input voltage vt - 3013 note 1 0.99 1.51 v hysteresis v hys - not e 1 0.37 v high level output voltage v oh 3006 2.4 v low level output voltage v ol 3007 0.4 v low level input current i il 3009 v in =gnd, v dd =v dd (max) - 1 1 a high level input current i ih 3010 v in =v dd =v dd (max) - 1 1 a a high level input current, pul l - down input i ihp 3010 v in =v dd =v dd (max) 5 70 a output leakage current i oz - outputs disabled, gnd < v out < v dd - 1 1 a output leakage current, pull - down output i ozhp - outputs disabled, v out = v dd 5 70 a input pin capacitance c in 3012 note 1 3 pf i/o pin capacitance c io 3012 note 1 7 pf standby supply current for array i ddsba 3005 static mode 4. 5 ma operating current for array i ddop 3005 v dd =3.6v 80 ma setup time spwifsel to sysclk ts1 3003 vdd = 3.6 v note 2 0 ns setup time memd[15:0] to sysclk memdcc[5:0] to sysclk ts2 3003 vdd = 3.6 v note 2 0 ns propagation delay sysclk to mema[23:0] tp1 3003 vdd = 3.6 v note 2 30 ns propagation delay sysclk to memd[15:0] sysclk to memdcc[5:0] tp2 3003 vdd = 3.6 v note 2 42 ns
ps - at7909e rev a sheet 9 / 20 propagation delay s ysclk to spwdout ? tp3 3003 vdd = 3.6 v note 2 41 ns propagation delay sysclk to spwdout ? tp4 3003 vdd = 3.6 v note 2 34 ns propagation delay sysclk to spwsout ? tp5 3003 vdd = 3.6 v note 2 41 ns propagation delay sysclk to spwsout ? tp6 3003 vdd = 3.6 v note 2 34 ns propagation delay sysclk to seqirq tp7 3003 vdd = 3.6 v note 2 53 ns notes : 1 / guaranteed but not tested 2/ test conditions: tester load 80 pf, vil = 0v, vih = vdd, input signals dynamic characteristics: tr,tf < 10ns, threshold voltage s: vol = voh = vdd/2 table 2. parameter drift values test symbol test method mil - std - 883 conditions drift limits unit low level input current iil 3009 as per table 1 0.1 a high level input current iih 3010 as per table 1 0.1 a output leakage lo w current iozl - as per table 1 0.1 a output leakage high current iozh - as per table 1 0.1 a supply current stand - by for array iddsba 3005 as per table 1 430 a low level output voltage buf2 vol 3007 as per table 1 100 mv high level output voltag e buf2 voh 3006 as per table 1 100 mv note : the above parameter shall be recorded before and after burn - in and life test to determine the delta.
ps - at7909e rev a sheet 10 / 20 figure 1. case outline. the package is a 256 - pin mqfp with 0.02 mil pin spacing and lid connected to gro und. mm inch a 2.41 3.18 0.095 0.125 a1 2.06 2.56 0.081 0.101 a2 0.05 0.36 0.002 0.014 c 0.10 0.20 0.004 0.008 d/e 53.23 55.74 2.095 2.195 d1/e1 36.83 37.34 1.450 1.470 e 0.508 bsc 0.020 bsc f 0.15 0.25 0.006 0.010 l 8.20 9.20 0.323 0.362 n1 64 n2 64
ps - at7909e rev a sheet 11 / 20 figure 2. terminal connections. pin signal name pin signal name pin signal name pin signal name 1 vss[8] 51 vdd[2] 101 testsignalin[2] 151 pdecclcwsamp[0] 2 memd[12] 52 mema[4] 102 testsignalin[3] 152 tmesin[e] 3 memd[11] 53 mema[3] 103 tmclk1 153 pdecclcwclk[0] 4 memd[10] 54 mema[2] 104 tmclk2 154 tmesclk[e] 5 vdd[8] 55 vss[1] 105 sysclk 155 tmesrdy[e] 6 memd[9] 56 mema[1] 106 poresetn 156 tmesrdy[d] 7 vss[18] 57 vss[19] 107 pdectcin[5] 157 tmesvalid[d] 8 vdd[18] 58 vdd[19] 108 pdectcclk[5] 158 tmesin[d] 9 memd[8] 59 mema[0] 109 pdectcact[5] 159 tmesclk[d] 10 memd[7] 60 vdd[1] 110 pdectcin[4] 160 vss[14] 11 memd[6] 61 memsize16 111 pdectcclk[4] 161 tmesrdy[c] 12 memd[5] 62 testsignalin[1] 112 pdectcact[4] 162 tmesvalid[c] 13 memd[4] 63 testmode 113 pdectcin[3] 163 tmesin[c] 14 memd[3] 64 testse 114 pdectcclk[3] 164 tmesclk[c] 15 vss[7] 65 jtagtdo 115 pdectcact[3] 165 extcpduifabort 16 testsignalin[6] 66 jtagtdi 116 pdectcin[2] 166 tmesvalid[b] 17 memd[2] 67 jtagtms 117 pd ectcclk[2] 167 extcpduifvalid 18 memd[1] 68 jtagtrstn 118 vss[15] 168 extcpduifrdy 19 vdd[7] 69 jtagtck 119 pdectcact[2] 169 extcpduifdata 20 memd[0] 70 pdecmapgena[5] 120 pdectcin[1] 170 tmesin[b] 21 memcs3n 71 vss[20] 121 vss[21] 171 extcpduifclk 22 vss[6] 72 vdd[20] 122 vdd[21] 172 tmesclk[b] 23 pdectcprior 73 pdecmapgena[4] 123 pdectcclk[1] 173 tmesrdy[b] 24 memcs2n 74 pdecmapgena[3] 124 vdd[15] 174 tmesrdy[a] 25 memcs0n 75 pdecmapgena[2] 125 pdectcact[1] 175 tmesvalid[a] 26 vdd[6] 76 pdecmapge na[1] 126 pdectcin[0] 176 tmesin[a] 27 memoen 77 pdecmapgena[0] 127 pdectcclk[0] 177 tmesclk[a] 28 memwen 78 vss[17] 128 pdectcact[0] 178 tmeenable 29 vss[5] 79 pdecmapdtr[5] 129 pdecclcwd[1] 179 vdd[14] 30 mema[19] 80 pdecmapdsr[5] 130 pdecclcwsamp[1] 180 tmetimestrb 31 mema[18] 81 pdecmapdtr[4] 131 pdecclcwclk[1] 181 tmeunencsync 32 vdd[5] 82 pdecmapdsr[4] 132 pdecmapswitch 182 tmeunencclk 33 mema[17] 83 vdd[17] 133 tmesvalid[h] 183 vss[13] 34 mema[16] 84 pdecmapdtr[3] 134 pdecauenable 184 tmeunen cout 35 vss[4] 85 pdecmapdsr[3] 135 vss[22] 185 vss[23] 36 mema[15] 86 pdecmapdtr[2] 136 vdd[22] 186 vdd[23] 37 mema[14] 87 pdecmapdsr[2] 137 tmesin[h] 187 vdd[13] 38 vdd[4] 88 pdecmapdtr[1] 138 tmesclk[h] 188 tmeencout 39 mema[13] 89 pdecmapdsr[1] 13 9 tmesrdy[h] 189 tmeencclk 40 mema[12] 90 pdecmapdtrg 140 tmesvalid[g] 190 tmeenciout 41 mema[11] 91 pdecmapdsrg 141 testsignalin[4] 191 tmeencqout 42 vss[3] 92 pdecmapdata 142 tmesin[g] 192 tmeenciqclk 43 mema[10] 93 pdecmapclk 143 tmesclk[g] 193 vss[ 12] 44 vdd[3] 94 pdecrfavn[3] 144 tmesrdy[g] 194 tmeclcwsamp 45 mema[9] 95 pdecrfavn[2] 145 tmesvalid[f] 195 tmeclcwclk 46 mema[8] 96 vss[16] 146 tmesin[f] 196 tmeclcwd[3] 47 mema[7] 97 pdecmapadt 147 tmesrdy[f] 197 tmeclcwd[2] 48 vss[2] 98 pdecrfavn[ 1] 148 tmesclk[f] 198 tmeclcwd[1]
ps - at7909e rev a sheet 12 / 20 pin signal name pin signal name pin signal name pin signal name 49 mema[6] 99 vdd[16] 149 tmesvalid[e] 199 vss[24] 50 mema[5] 100 pdecrfavn[0] 150 pdecclcwd[0] 200 vdd[24] 201 tmeclcwd[0] 215 spwdinb 229 cpdmstrb 243 testsignalout[5] 202 reinit 216 spwifsel 230 cselrmon 244 testsig nalin[5] 203 ciinclk 217 spwsina 231 cselstatusin[2] 245 memdcc[5] 204 ciindata 218 spwdina 232 cselstatusin[1] 246 memdcc[4] 205 vdd[12] 219 spwclk 233 cselstatusin[0] 247 vdd[9] 206 ciinrdy 220 vdd[11] 234 vdd[10] 248 memdcc[3] 207 ciinvalid 221 sp wsout 235 irq 249 vss[25] 208 cioutrdy 222 spwdout 236 cselstatusout[2] 250 vdd[25] 209 cioutclk 223 cpdmclkalive 237 cselstatusout[1] 251 memdcc[2] 210 cioutdata 224 cpdmclktoggle 238 cselstatusout[0] 252 memdcc[1] 211 vss[11] 225 cpdmclk 239 testsign alout[2] 253 memdcc[0] 212 cioutvalid 226 vss[10] 240 testsignalout[3] 254 memd[15] 213 testsignalout[1] 227 cpdmser 241 vss[9] 255 memd[14] 214 spwsinb 228 cpdmarmn 242 testsignalout[4] 256 memd[13] signals pins are described in at7909e datasheet.
ps - at7909e rev a sheet 13 / 20 f igure 3. block diagram testmode packet telemetry encoder (tme) mema [19:0] memd [15:0] promcsn memdcc [5:0] cpdmstrb cpdmarmn cpdmser cpdmclk cselstatusin [2:0] cselstatusout [2:0] cselrmon poresetn testse extreclacn ramcsn tmclk tmeunencclk tmeunencout tmeunencsync tmeencclk tmeencout tmetimestrb pdectcact [0:5] pdectcclk [0:5] pdectcin [0:5] pdecrfavn [0:3] pdecclcwclk [0:1] pdecclcwsamp [0:1] pdecclcwd [0:1] memoen memwen tmesclk [a:h] tmesin [a:h] tmesrdy [a:h] tmesvalid [a:h] tmeencqout pdecmapadt pdecmapclk pdecmapdata pdecmapdtrg pdecmapdsrg pdecmapgena [5:0] tmeclcwclk tmeclcwsamp tmeclcwd [1:4] pdecmapdsr [1:5] pdecauenable sysclk pdecmapdtr [1:5] tmeenable clock & reset spwclk internal scan controller spwdina spwsina spwdout spwsout memsize16 memory interface cpdmclkalive cpdmclktoggle spwclk tmclk pdectcprior pdecmapswitch tmeenciout tmeenciqclk legend: buses are numbered [high:low]. separate signals are numbered [low:high] spwdinb spwsinb extcpduifclk extcpduifdata extcpduifrdy extcpduifvalid extcpduifabort command pulse selector (csel) command pulse distribution (cpdm) packet telecommand decoder (pdec3) ciinclk cioutclk ciinvalid ciindata ciinrdy cioutrdy cioutvalid cioutdata sysclk spwclk tmclk1 testsignalin [1:5] jtagtck jtagtdi jtagtms jtagtrstn jtagtdo jtag tap controller spwifsel configuration irq tmclk2 internal bus map address 6 map address 0 tconly tc request rm/tc request cpdm request control interface (ci) spacewire (spw) vrc 0-6 vc a-g vrc 7 pm request external cpdu interface (extcpduif) packetwire multiplexed access point (map) telecommand input clcw output command pulse output clcw input telemetry output packetwire data input packetwire command pulse input spacewire control & data input/output (nominal & redundant) packetwire control input packetwire control output asynchronous memory interface configuration command status clock alive detection time strobe configuration configuration configuration power-on reset clocks jtag interface test configuration reinit interrupt restart configuration testsignalout [1:5]
ps - at7909e rev a sheet 14 / 20 figure 4 . electrical circuit for power burn - in and operating life test. characteristics symbol conditions unit ambient temperature tamb 125 (+0/ - 5) c positive supply voltage vcc 3.7v (+0.1 / - 0. 1) v negative supply voltage gnd 0 v forcing inputs : s1 = 1.65 mhz s3 = 412.50 khz s6 = 51.56 khz s9 = 100.70 hz s10 = 50.30 hz all signals are issued from the same clock and there is no overlap on timings - inputs must be wired to a defined level: vcc , gnd or driver signals - connecting an input to vcc 'or' gnd must always be through a 2.2k serie resistor forcing outputs: - output must be wired to vcc and gnd - connecting an output to vcc 'and' gnd must always be through two 5.6k series resistors. forc ing inputs/outputs: - i/o must be wired as input or output following previous definition. - by default i/o are considered as input pin number pad numb er signal model type pull type resistance wired 1 1 vsb28 pvssb vsb 0 gnd 2 2 memd_12_ picv:po33v:prd 6 vi/o pd 2.2k gnd 3 3 memd_11_ picv:po33v:prd6 vi/o pd 2.2k gnd 4 4 memd_10_ picv:po33v:prd6 vi/o pd 2.2k gnd 5 5 vdb26 pvddvb vdb 0 vcc 6 6 memd_9_ picv:po33v:prd6 vi/o pd 2.2k gnd 7 515 vsa27 pvssa vsa 0 gnd 7 525 vsa24 pvssa vsa 0 gnd 7 53 6 vsa19 pvssa vsa 0 gnd 8 274 vda22 pvdda vda 0 vcc 8 264 vda25 pvdda vda 0 vcc 8 287 vda16 pvdda vda 0 vcc 9 7 memd_8_ picv:po33v:prd6 vi/o pd 2.2k gnd 10 8 memd_7_ picv:po33v:prd6 vi/o pd 2.2k gnd 11 9 memd_6_ picv:po33v:prd6 vi/o pd 2.2k g nd 12 10 memd_5_ picv:po33v:prd6 vi/o pd 2.2k gnd 13 11 memd_4_ picv:po33v:prd6 vi/o pd 2.2k gnd 14 12 memd_3_ picv:po33v:prd6 vi/o pd 2.2k gnd 15 13 vsb23 pvssb vsb 0 gnd 16 14 pdectcdyn picv:prd6v i pd 2.2k s6
ps - at7909e rev a sheet 15 / 20 17 15 memd_2_ picv:po33v:prd6 vi/o p d 2.2k gnd 18 16 memd_1_ picv:po33v:prd6 vi/o pd 2.2k gnd 19 17 vdb21 pvddvb vdb 0 vcc 20 18 memd_0_ picv:po33v:prd6 vi/o pd 2.2k gnd 21 19 memcsn_3_ po66vf o/z 5.6k vcc - gnd 22 20 vsb20 pvssb vsb 0 gnd 23 21 pdectcprior picv:prd6v i pd 2.2k s6 24 22 memcsn_2_ po66vf o/z 5.6k vcc - gnd 25 23 memcsn_0_ po66vf o/z 5.6k vcc - gnd 26 24 vdb18 pvddvb vdb 0 vcc 27 25 memoen po66vf o/z 5.6k vcc - gnd 28 26 memwen po66vf o/z 5.6k vcc - gnd 29 27 vsb17 pvssb vsb 0 gnd 30 28 mema_19_ po66vf o/z 5.6k vcc - gnd 31 29 mema_18_ po66vf o/z 5.6k vcc - gnd 32 30 vdb15 pvddvb vdb 0 vcc 33 31 mema_17_ po66vf o/z 5.6k vcc - gnd 34 32 mema_16_ po66vf o/z 5.6k vcc - gnd 35 33 vsb14 pvssb vsb 0 gnd 36 34 mema_15_ po66vf o/z 5.6k vcc - gnd 37 35 mem a_14_ po66vf o/z 5.6k vcc - gnd 38 36 vdb12 pvddvb vdb 0 vcc 39 37 mema_13_ po66vf o/z 5.6k vcc - gnd 40 38 mema_12_ po66vf o/z 5.6k vcc - gnd 41 39 mema_11_ po66vf o/z 5.6k vcc - gnd 42 40 vsb10 pvssb vsb 0 gnd 43 41 mema_10_ po66vf o/z 5.6k v cc - gnd 44 42 vdb9 pvddvb vdb 0 vcc 45 43 mema_9_ po66vf o/z 5.6k vcc - gnd 46 44 mema_8_ po66vf o/z 5.6k vcc - gnd 47 45 mema_7_ po66vf o/z 5.6k vcc - gnd 48 46 vsb7 pvssb vsb 0 gnd 49 47 mema_6_ po66vf o/z 5.6k vcc - gnd 50 48 mema_5_ po66vf o/ z 5.6k vcc - gnd 51 49 vdb6 pvddvb vdb 0 vcc 52 50 mema_4_ po66vf o/z 5.6k vcc - gnd 53 51 mema_3_ po66vf o/z 5.6k vcc - gnd 54 52 mema_2_ po66vf o/z 5.6k vcc - gnd 55 53 vsb4 pvssb vsb 0 gnd 56 54 mema_1_ po66vf o/z 5.6k vcc - gnd 57 570 vsa3 p vssa vsa 0 gnd 57 560 vsa8 pvssa vsa 0 gnd 57 547 vsa13 pvssa vsa 0 gnd 58 309 vda5 pvdda vda 0 vcc 58 318 vda1 pvdda vda 0 vcc 58 297 vda11 pvdda vda 0 vcc 59 55 mema_0_ po66vf o/z 5.6k vcc - gnd 60 56 vdb2 pvddvb vdb 0 vcc
ps - at7909e rev a sheet 16 / 20 61 57 mem siz picv i 2.2k s6 62 58 extdaccess picv i 2.2k s6 63 59 testmode picv:prd6v i pd 2.2k vcc 64 60 testse picv:prd6v i pd 2.2k s10 65 61 jtagtdo po22v o/z 5.6k vcc - gnd 66 62 jtagtdi picv:prd6v i pd 2.2k s6 67 63 jtagtms picv:prd6v i pd 2.2k s6 6 8 64 jtagtrstn picv:prd6v i pd 2.2k s10 69 65 jtagtck picv:prd6v i pd 2.2k s1 70 66 pdecmapgena_5_ po22v o/z 5.6k vcc - gnd 71 600 vsa76 pvssa vsa 0 gnd 71 589 vsa79 pvssa vsa 0 gnd 71 579 vsa82 pvssa vsa 0 gnd 72 328 vda81 pvdda vda 0 vcc 7 2 350 vda75 pvdda vda 0 vcc 72 337 vda78 pvdda vda 0 vcc 73 67 pdecmapgena_4_ po22v o/z 5.6k vcc - gnd 74 68 pdecmapgena_3_ po22v o/z 5.6k vcc - gnd 75 69 pdecmapgena_2_ po22v o/z 5.6k vcc - gnd 76 70 pdecmapgena_1_ po22v o/z 5.6k vcc - gnd 77 71 pdecmapgena_0_ po22v o/z 5.6k vcc - gnd 78 72 vsb80 pvssb vsb 0 gnd 79 73 pdecmapdtr_5_ picv:prd6v i pd 2.2k s6 80 74 pdecmapdsr_5_ po22v o/z 5.6k vcc - gnd 81 75 pdecmapdtr_4_ picv:prd6v i pd 2.2k s6 82 76 pdecmapdsr_4_ po22v o/z 5.6k vcc - gnd 8 3 77 vdb77 pvddvb vdb 0 vcc 84 78 pdecmapdtr_3_ picv:prd6v i pd 2.2k s6 85 79 pdecmapdsr_3_ po22v o/z 5.6k vcc - gnd 86 80 pdecmapdtr_2_ picv:prd6v i pd 2.2k s6 87 81 pdecmapdsr_2_ po22v o/z 5.6k vcc - gnd 88 82 pdecmapdtr_1_ picv:prd6v i pd 2.2k s6 89 83 pdecmapdsr_1_ po22v o/z 5.6k vcc - gnd 90 84 pdecmapdtrg picv:prd6v i pd 2.2k s6 91 85 pdecmapdsrg po22v o/z 5.6k vcc - gnd 92 86 pdecmapdata po22v o/z 5.6k vcc - gnd 93 87 pdecmapclk po33v o/z 5.6k vcc - gnd 94 88 pdecrfavn_3_ picsv:prd6v i p d 2.2k s9 95 89 pdecrfavn_2_ picsv:prd6v i pd 2.2k s9 96 90 vsb74 pvssb vsb 0 gnd 97 91 pdecmapadt po22v o/z 5.6k vcc - gnd 98 92 pdecrfavn_1_ picsv:prd6v i pd 2.2k s6 99 93 vdb73 pvddvb vdb 0 vcc 100 94 pdecrfavn_0_ picsv:prd6v i pd 2.2k s6 101 95 m1553clk picv i 2.2k s1 102 96 obtsrcclk picv i 2.2k s1 103 97 tmclk1 picv i 2.2k s1 104 98 tmclk2 picv i 2.2k s1
ps - at7909e rev a sheet 17 / 20 105 99 sysclk picv i 2.2k s1 106 100 poresetn picsv i 2.2k vcc 107 101 pdectcin_5_ picsv:prd6v i pd 2.2k s6 108 102 pde ctcclk_5_ picsv:prd6v i pd 2.2k s3 109 103 pdectcact_5_ picsv:prd6v i pd 2.2k s6 110 104 pdectcin_4_ picsv:prd6v i pd 2.2k s6 111 105 pdectcclk_4_ picsv:prd6v i pd 2.2k s3 112 106 pdectcact_4_ picsv:prd6v i pd 2.2k s6 113 107 pdectcin_3_ picsv:prd6v i pd 2.2k s6 114 108 pdectcclk_3_ picsv:prd6v i pd 2.2k s3 115 109 pdectcact_3_ picsv:prd6v i pd 2.2k s6 116 110 pdectcin_2_ picsv:prd6v i pd 2.2k s6 117 111 pdectcclk_2_ picsv:prd6v i pd 2.2k s3 118 112 vsb68 pvssb vsb 0 gnd 119 113 pdectcact_2_ pi csv:prd6v i pd 2.2k s6 120 114 pdectcin_1_ picsv:prd6v i pd 2.2k s6 121 624 vsa70 pvssa vsa 0 gnd 121 611 vsa72 pvssa vsa 0 gnd 121 634 vsa67 pvssa vsa 0 gnd 122 361 vda71 pvdda vda 0 vcc 122 373 vda69 pvdda vda 0 vcc 122 382 vda65 pvdda v da 0 vcc 123 115 pdectcclk_1_ picsv:prd6v i pd 2.2k s3 124 116 vdb66 pvddvb vdb 0 vcc 125 117 pdectcact_1_ picsv:prd6v i pd 2.2k s6 126 118 pdectcin_0_ picsv:prd6v i pd 2.2k s6 127 119 pdectcclk_0_ picsv:prd6v i pd 2.2k s3 128 120 pdectcact_0_ pi csv:prd6v i pd 2.2k s6 129 121 pdecclcwd_1_ po22v o/z 5.6k vcc - gnd 130 122 pdecclcwsamp_1_ picsv:prd6v i pd 2.2k s6 131 123 pdecclcwclk_1_ picsv:prd6v i pd 2.2k s3 132 124 pdecmapswitch picv:prd6v i pd 2.2k s6 133 125 tmesvalidnom_7_ picv:prd6v i pd 2.2k s6 134 126 pdecauenable picsv:prd6v i pd 2.2k s6 135 664 vsa60 pvssa vsa 0 gnd 135 654 vsa62 pvssa vsa 0 gnd 135 643 vsa64 pvssa vsa 0 gnd 136 415 vda59 pvdda vda 0 vcc 136 402 vda61 pvdda vda 0 vcc 136 392 vda63 pvdda vda 0 vcc 1 37 127 tmesinnom_7_ picv:prd6v i pd 2.2k s6 138 128 tmesclknom_7_ picv:prd6v i pd 2.2k s1 139 129 tmesrdy_7_ po22v o/z 5.6k vcc - gnd 140 130 tmesvalidnom_6_ picv:prd6v i pd 2.2k s6 141 131 tmesinred_6_ picv:prd6v i pd 2.2k s6 142 132 tmesinnom_6_ pic v:prd6v i pd 2.2k s6 143 133 tmesclknom_6_ picv:prd6v i pd 2.2k s1 144 134 tmesrdy_6_ po22v o/z 5.6k vcc - gnd
ps - at7909e rev a sheet 18 / 20 145 135 tmesvalidnom_5_ picv:prd6v i pd 2.2k s6 146 136 tmesinnom_5_ picv:prd6v i pd 2.2k s6 147 137 tmesrdy_5_ po22v o/z 5.6k vcc - gnd 14 8 138 tmesclknom_5_ picv:prd6v i pd 2.2k s1 149 139 tmesvalidnom_4_ picv:prd6v i pd 2.2k s6 150 140 pdecclcwd_0_ po22v o/z 5.6k vcc - gnd 151 141 pdecclcwsamp_0_ picsv:prd6v i pd 2.2k s6 152 142 tmesinnom_4_ picv:prd6v i pd 2.2k s6 153 143 pdecclcwclk _0_ picsv:prd6v i pd 2.2k s3 154 144 tmesclknom_4_ picv:prd6v i pd 2.2k s1 155 145 tmesrdy_4_ po22v o/z 5.6k vcc - gnd 156 146 tmesrdy_3_ po22v o/z 5.6k vcc - gnd 157 147 tmesvalidnom_3_ picv:prd6v i pd 2.2k s6 158 148 tmesinnom_3_ picv:prd6v i pd 2.2 k s6 159 149 tmesclknom_3_ picv:prd6v i pd 2.2k s1 160 150 vsb58 pvssb vsb 0 gnd 161 151 tmesrdy_2_ po22v o/z 5.6k vcc - gnd 162 152 tmesvalidnom_2_ picv:prd6v i pd 2.2k s6 163 153 tmesinnom_2_ picv:prd6v i pd 2.2k s6 164 154 tmesclknom_2_ picv:prd 6v i pd 2.2k s1 165 155 extcpduifabort picsv:prd6v i pd 2.2k s6 166 156 tmesvalidnom_1_ picv:prd6v i pd 2.2k s6 167 157 extcpduifvalid picsv:prd6v i pd 2.2k s6 168 158 extcpduifrdy po22v o/z 5.6k vcc - gnd 169 159 extcpduifdata picsv:prd6v i pd 2.2k s 6 170 160 tmesinnom_1_ picv:prd6v i pd 2.2k s6 171 161 extcpduifclk picsv:prd6v i pd 2.2k s1 172 162 tmesclknom_1_ picv:prd6v i pd 2.2k s1 173 163 tmesrdy_1_ po22v o/z 5.6k vcc - gnd 174 164 tmesrdy_0_ po22v o/z 5.6k vcc - gnd 175 165 tmesvalidnom_0_ picv:prd6v i pd 2.2k s6 176 166 tmesinnom_0_ picv:prd6v i pd 2.2k s6 177 167 tmesclknom_0_ picv:prd6v i pd 2.2k s1 178 168 tmeenable picsv:prd6v i pd 2.2k s6 179 169 vdb54 pvddvb vdb 0 vcc 180 170 tmetimestrb po22v o/z 5.6k vcc - gnd 181 171 tmeun encsync po33v o/z 5.6k vcc - gnd 182 172 tmeunencclk po66vf o/z 5.6k vcc - gnd 183 173 vsb52 pvssb vsb 0 gnd 184 174 tmeunencout po66vf o/z 5.6k vcc - gnd 185 688 vsa55 pvssa vsa 0 gnd 185 698 vsa51 pvssa vsa 0 gnd 185 675 vsa57 pvssa vsa 0 g nd 186 446 vda49 pvdda vda 0 vcc 186 437 vda53 pvdda vda 0 vcc 186 425 vda56 pvdda vda 0 vcc 187 175 vdb50 pvddvb vdb 0 vcc 188 176 tmeencout po66vf o/z 5.6k vcc - gnd
ps - at7909e rev a sheet 19 / 20 189 177 tmeencclk po66vf o/z 5.6k vcc - gnd 190 178 tmeenc iout po33 v o/z 5.6k vcc - gnd 191 179 tmeenc qout po33v o/z 5.6k vcc - gnd 192 180 tmeenciqclk po33v o/z 5.6k vcc - gnd 193 181 vsb48 pvssb vsb 0 gnd 194 182 tmeclcwsamp po22v o/z 5.6k vcc - gnd 195 183 tmeclcwclk po22v o/z 5.6k vcc - gnd 196 184 tmecl cwd_3_ picv:prd6v i pd 2.2k s6 197 185 tmeclcwd_2_ picv:prd6v i pd 2.2k s6 198 186 tmeclcwd_1_ picv:prd6v i pd 2.2k s6 199 717 vsa44 pvssa vsa 0 gnd 199 728 vsa41 pvssa vsa 0 gnd 199 707 vsa47 pvssa vsa 0 gnd 200 456 vda46 pvdda vda 0 vcc 20 0 478 vda39 pvdda vda 0 vcc 200 465 vda43 pvdda vda 0 vcc 201 187 tmeclcwd_0_ picv:prd6v i pd 2.2k s6 202 188 reinit picsv:prd6v i pd 2.2k s6 203 189 ciinclk picv:prd6v i pd 2.2k s1 204 190 ciindata picv:prd6v i pd 2.2k s6 205 191 vdb45 pvddvb vd b 0 vcc - gnd 206 192 ciinrdy po33v o/z 5.6k vcc - gnd 207 193 ciinvalid picv:prd6v i pd 2.2k s6 208 194 cioutrdy picv:prd6v i pd 2.2k s6 209 195 cioutclk po33v o/z 5.6k vcc - gnd 210 196 cioutdata po33v o/z 5.6k vcc - gnd 211 197 vsb42 pvssb vsb 0 gnd 212 198 cioutvalid po33v o/z 5.6k vcc - gnd 213 199 spwena po22v o/z 5.6k vcc - gnd 214 200 spwsinb picv i 2.2k s6 215 201 spwdinb picv i 2.2k s6 216 202 spwifsel picsv:prd6v i pd 2.2k s6 217 203 spwsina picv i 2.2k s1 218 204 spwdina pic v i 2.2k s6 219 205 spwclk picv i 2.2k s1 220 206 vdb40 pvddvb vdb 0 vcc 221 207 spwsout po33v o/z 5.6k vcc - gnd 222 208 spwdout po33v o/z 5.6k vcc - gnd 223 209 cpdmclkalive picsv i 2.2k s6 224 210 cpdmclktoggle po33v o/z 5.6k vcc - gnd 225 211 cpdmclk po33v o/z 5.6k vcc - gnd 226 212 vsb38 pvssb vsb 0 227 213 cpdmser po33v o/z 5.6k vcc - gnd 228 214 cpdmarmn po22v o/z 5.6k vcc - gnd 229 215 cpdmstrb po22v o/z 5.6k vcc - gnd 230 216 cselrmon picsv:prd6v i pd 2.2k s6 231 217 c selstsin_2_ picsv:prd6v i pd 2.2k s6 232 218 cselstsin_1_ picsv:prd6v i pd 2.2k s6
ps - at7909e rev a sheet 20 / 20 233 219 cselstsin_0_ picsv:prd6v i pd 2.2k s6 234 220 vdb35 pvddvb vdb 0 vcc 235 221 seqirq po22v o/z 5.6k vcc - gnd 236 222 cselstsout_2_ po22v o/z 5.6k vcc - gnd 2 37 223 cselstsout_1_ po22v o/z 5.6k vcc - gnd 238 224 cselstsout_0_ po22v o/z 5.6k vcc - gnd 239 225 txbihb po22v o/z 5.6k vcc - gnd 240 226 txaihb po22v o/z 5.6k vcc - gnd 241 227 vsb33 pvssb vsb 0 gnd 242 228 dataoutn po22v o/z 5.6k vcc - gnd 243 229 dataoutp po22v o/z 5.6k vcc - gnd 244 230 datainan picsv:prd6v i pd 2.2k s1 245 231 memdcc_5_ picv:po33v:prd6v i/o pd 2.2k gnd 246 232 memdcc_4_ picv:po33v:prd6v i/o pd 2.2k gnd 247 233 vdb31 pvddvb vdb 0 vcc 248 234 memdcc_3_ picv:po33v:prd6v i/o pd 2.2k gnd 249 753 vsa34 pvssa vsa 0 gnd 249 762 vsa30 pvssa vsa 0 gnd 249 739 vsa37 pvssa vsa 0 gnd 250 489 vda36 pvdda vda 0 vcc 250 501 vda32 pvdda vda 0 vcc 250 510 vda29 pvdda vda 0 vcc 251 235 memdcc_2_ picv:po33v:prd6v i/o pd 2.2k gnd 252 236 memdcc_1_ picv:po33v:prd6v i/o pd 2.2k gnd 253 237 memdcc_0_ picv:po33v:prd6v i/o pd 2.2k gnd 254 238 memd_15_ picv:po33v:prd6v i/o pd 2.2k gnd 255 239 memd_14_ picv:po33v:prd6v i/o pd 2.2k gnd 256 240 memd_13_ picv:po33v:prd6v i/o pd 2.2k gnd

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